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From "Michael McCandless (JIRA)" <j...@apache.org>
Subject [jira] [Commented] (LUCENE-4460) Test exception handling better/easier than testThreadInterruptDeadlock()
Date Fri, 05 Oct 2012 16:16:02 GMT

    [ https://issues.apache.org/jira/browse/LUCENE-4460?page=com.atlassian.jira.plugin.system.issuetabpanels:comment-tabpanel&focusedCommentId=13470425#comment-13470425
] 

Michael McCandless commented on LUCENE-4460:
--------------------------------------------

+1
                
> Test exception handling better/easier than testThreadInterruptDeadlock()
> ------------------------------------------------------------------------
>
>                 Key: LUCENE-4460
>                 URL: https://issues.apache.org/jira/browse/LUCENE-4460
>             Project: Lucene - Core
>          Issue Type: Bug
>          Components: general/test
>            Reporter: Robert Muir
>
> currently the fact that MockDirectoryWrapper has throttlers and such that sleep, combined
with the fact this test interrupts, makes a good test for exception handling.
> The problem is this is really crappy to debug: things dont reproduce, you have to use
hundreds or thousands of iterations, etc etc.
> I think it would be better if we made it possible for MockIndexInput to throw random
exceptions like MockIndexOutput and had a single threaded test that just threw random exceptions?
This way it would reproduce...

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