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From "Enis Soztutar (JIRA)" <j...@apache.org>
Subject [jira] [Commented] (HBASE-8700) IntegrationTestBigLinkedList can fail due to random number collision
Date Fri, 07 Jun 2013 20:32:21 GMT

    [ https://issues.apache.org/jira/browse/HBASE-8700?page=com.atlassian.jira.plugin.system.issuetabpanels:comment-tabpanel&focusedCommentId=13678398#comment-13678398
] 

Enis Soztutar commented on HBASE-8700:
--------------------------------------

Why don't you use UUID v4? 
{code}
+          byte[] bytes = new byte[16];
+          rand.nextBytes(bytes);
{code}
                
> IntegrationTestBigLinkedList can fail due to random number collision
> --------------------------------------------------------------------
>
>                 Key: HBASE-8700
>                 URL: https://issues.apache.org/jira/browse/HBASE-8700
>             Project: HBase
>          Issue Type: Bug
>            Reporter: Sergey Shelukhin
>            Assignee: Sergey Shelukhin
>         Attachments: HBASE-8700-v0.patch
>
>
> The test can fail due to random number collision, claiming there are unreferenced elements
for obvious reasons (we rewrite some link). Original Accumulo test has one-stage generation
so it doesn't count unreferenced elements as failures, only undefined ones. With 200m longs
out of half-long range the probability of collision is approx 0.2%.
> Moreover, without some way to debug, it's hard to debug what keys should be looked at
in such cases

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