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From "Stephen Chu (Created) (JIRA)" <>
Subject [jira] [Created] (BIGTOP-287) Integrating test for HBASE-4570
Date Fri, 02 Dec 2011 18:41:39 GMT
Integrating test for HBASE-4570

                 Key: BIGTOP-287
             Project: Bigtop
          Issue Type: Test
          Components: Tests
            Reporter: Stephen Chu

In HBASE-4570, when scanning a table during concurrent writes, rows that have multiple column
families sometimes get split into two rows.

This patch integrates Jon Hsieh's test for this bug. The test creates a table of 25k rows,
each with 10 column families. It then scans the table while performing concurrent writes a
configurable number of times and looks for split rows. The test passes if there are now split
rows, and fails otherwise.

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