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From "Josh Elser (JIRA)" <j...@apache.org>
Subject [jira] [Resolved] (ACCUMULO-2849) Add scan batch size configurability and write delay to memory stress test
Date Mon, 11 May 2015 16:41:03 GMT

     [ https://issues.apache.org/jira/browse/ACCUMULO-2849?page=com.atlassian.jira.plugin.system.issuetabpanels:all-tabpanel
]

Josh Elser resolved ACCUMULO-2849.
----------------------------------
    Resolution: Fixed

> Add scan batch size configurability and write delay to memory stress test
> -------------------------------------------------------------------------
>
>                 Key: ACCUMULO-2849
>                 URL: https://issues.apache.org/jira/browse/ACCUMULO-2849
>             Project: Accumulo
>          Issue Type: Improvement
>          Components: test
>            Reporter: Bill Havanki
>            Assignee: Bill Havanki
>            Priority: Minor
>             Fix For: 1.7.0, 1.6.1, 1.5.2
>
>          Time Spent: 0.5h
>  Remaining Estimate: 0h
>
> I had the opportunity to work with the memory stress tool created under ACCUMULO-2789.
Two features which I added to help the tests along would be helpful:
> # Allowing the scanner batch size to be configured, to reduce memory demand when fetching
very large keys or values
> # Adding a configurable write delay, to reduce pressure on tablet servers to minor compact.



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